Veille NAE : Fiabilite 20190304

Chaque semaine NAE vous propose une veille technologique sur une thématique de sa feuille de route technologique.

Aujourd’hui retrouvez sa veille sur la thématique Fiabilité qui abordera :

  • SiC MOSFET gate driver supports hundreds of kW without a booster
    Source : www.eenewspower.com – 2019-02-27
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  • STMicroelectronics : MACOM et STMicroelectronics accélèrent sur la technologie GaN sur silicium …
    Source : www.zonebourse.com – 2019-02-25
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  • 650V SiC Schottky diodes boost efficiency, reliability – Electronic Products & Technology
    Source : www.ept.ca – 2019-02-20
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  • Diamond and gallium nitride semiconductors take off – Cleanroom Technology
    Source : www.cleanroomtechnology.com – 2019-02-15
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  • The Great Semi Debate: SiC or GaN? – Power Electronics Technology
    Source : www.powerelectronics.com – 2019-02-15
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  • Performance Analysis of a Single-phase GaN-based 3L-ANPC Inverter for Photovoltaic Applications
    Source : ieeexplore.ieee.org – 2019-02-08
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  • Optimization Method to Eliminate Turn-on Overvoltage Issue of the High Voltage SiC Super-Cascode Power Switch
    Source : ieeexplore.ieee.org – 2019-02-08
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  • Heterogeneously Integrated GaN on Si Photonic Integrated Circuits
    Source : 2019-02-05 – www.flintbox.com
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  • Reliability Analysis of SiC MOSFET Power Module for More Electric Aircraft Motor Drive Applications
    Source : ieeexplore.ieee.org – 2019-02-04
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  • Ultrafast Rectifier for Variable-Frequency Applications
    Source : ieeexplore.ieee.org – 2019-02-04
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  • Transient thermal storage of excess heat using eutectic BiSn as phase change material for the thermal management of an electronic power module: design, technology, performance and reliability within a system approach
    Source : ieeexplore.ieee.org – 2019-02-04
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