{"id":103,"date":"2019-07-01T10:20:49","date_gmt":"2019-07-01T08:20:49","guid":{"rendered":"https:\/\/projets.nae.fr\/?p=103"},"modified":"2019-07-01T10:20:49","modified_gmt":"2019-07-01T08:20:49","slug":"veille-nae-fiabilite-electronique-20190701","status":"publish","type":"post","link":"https:\/\/projets.nae.fr\/veille-nae-fiabilite-electronique-20190701\/","title":{"rendered":"Veille NAE : Fiabilit\u00e9 \u00e9lectronique 20190701"},"content":{"rendered":"<p>Chaque semaine NAE vous propose une veille technologique sur une th\u00e9matique de sa feuille de route technologique.<\/p>\n<p>Aujourd\u2019hui retrouvez sa veille sur\u00a0la th\u00e9matique Fiabilit\u00e9\u00a0\u00e9lectronique qui abordera\u00a0:<\/p>\n<ul>\n<li>Surface Activation and Pretreatments for Biocompatible Metals and Alloys Used in Biomedical Applications<br \/>\nSource : www.hindawi.com &#8211; 2019-06-02<br \/>\n<a href=\"http:\/\/www.hindawi.com\/journals\/ijbm\/2019\/3806504\/\" target=\"_blank\" rel=\"noopener noreferrer\">Lire la suite<\/a><\/li>\n<li>Degradation and failure mechanism of AlGaN-based UVC-LEDs<br \/>\nSource : www.scopus.com &#8211; 2019-06-01<br \/>\n<a href=\"https:\/\/www.scopus.com\/inward\/record.uri?partnerID=HzOxMe3b&amp;scp=85064261072&amp;origin=inward\" target=\"_blank\" rel=\"noopener noreferrer\">Lire la suite<\/a><\/li>\n<li>Why it&rsquo;s tough to characterize SiC power MOSFETs<br \/>\nSource : www.powerelectronictips.com &#8211; 2019-05-29<br \/>\n<a href=\"https:\/\/www.powerelectronictips.com\/why-its-tough-to-characterize-sic-power-mosfets\/?utm_source=feedburner&amp;utm_medium=feed&amp;utm_campaign=Feed%3A+PowerSupplyTips+%28Power+Supply+Tips%29\" target=\"_blank\" rel=\"noopener noreferrer\">Lire la suite<\/a><\/li>\n<li>Epitaxy Wafer: The Fundamental Phase for Micro LED Display &#8211; LEDinside<br \/>\nSource : www.ledinside.com &#8211; 2019-05-29<br \/>\n<a href=\"https:\/\/www.ledinside.com\/news\/2019\/5\/epitaxy_wafer_the_fundamental_phase_microled_display\" target=\"_blank\" rel=\"noopener noreferrer\">Lire la suite<\/a><\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"<p>Chaque semaine NAE vous propose une veille technologique sur une th\u00e9matique de sa feuille de route technologique. Aujourd\u2019hui retrouvez sa veille sur\u00a0la th\u00e9matique Fiabilit\u00e9\u00a0\u00e9lectronique qui abordera\u00a0: Surface Activation and Pretreatments [&hellip;]<\/p>\n","protected":false},"author":4,"featured_media":53,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":"","footnotes":""},"categories":[3],"tags":[],"acf":[],"_links":{"self":[{"href":"https:\/\/projets.nae.fr\/wp-json\/wp\/v2\/posts\/103"}],"collection":[{"href":"https:\/\/projets.nae.fr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/projets.nae.fr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/projets.nae.fr\/wp-json\/wp\/v2\/users\/4"}],"replies":[{"embeddable":true,"href":"https:\/\/projets.nae.fr\/wp-json\/wp\/v2\/comments?post=103"}],"version-history":[{"count":1,"href":"https:\/\/projets.nae.fr\/wp-json\/wp\/v2\/posts\/103\/revisions"}],"predecessor-version":[{"id":104,"href":"https:\/\/projets.nae.fr\/wp-json\/wp\/v2\/posts\/103\/revisions\/104"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/projets.nae.fr\/wp-json\/wp\/v2\/media\/53"}],"wp:attachment":[{"href":"https:\/\/projets.nae.fr\/wp-json\/wp\/v2\/media?parent=103"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/projets.nae.fr\/wp-json\/wp\/v2\/categories?post=103"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/projets.nae.fr\/wp-json\/wp\/v2\/tags?post=103"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}